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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August ... (Lecture Notes in Computer Science, 4109) by Dit-Yan Yeung (editor), James T. Kwok (editor), Ana Fred (editor), Fabio Roli (editor), Dick de Ridder (editor) is a computer science book available to read on EtoBox.
What is Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August ... (Lecture Notes in Computer Science, 4109) about?
<p>This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.
Who reads Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August ... (Lecture Notes in Computer Science, 4109)?
It is typically read by working professionals who need an authoritative practice reference.
Common subject areas: medicine, law, business, engineering.
- Author
- Dit-Yan Yeung (editor), James T. Kwok (editor), Ana Fred (editor), Fabio Roli (editor), Dick de Ridder (editor)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Published
- 2006
- Language
- EN
- ISBN
- 9783540372417
- Category
- computer science
- Subjects
- Mathematics, Engineering, Image Processing
- Updated
- 2026-03-25
Other editions & translations
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