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About this Physics and Astronomy article
Structure-film thickness relationship study of sputtered NiO∕Ni bilayers using depth profiling and atomic force microscopy techniques by Abbey, Brian; Lipp, John D.; Barber, Zoe H.; Rayment, Trevor is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Abbey, Brian; Lipp, John D.; Barber, Zoe H.; Rayment, Trevor
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 2006
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)