About this scholarly article

Proceedings of the Ninth Asian Test Symposium - A realistic fault model for flash memories by Yea-Ling Horng, ; Jing-Reng Huang, ; Tsin-Yuan Chang, is a scholarly article available to read on EtoBox.

Author

Yea-Ling Horng, ; Jing-Reng Huang, ; Tsin-Yuan Chang,

Publisher

IEEE Comput. Soc

Published

2000

Language

EN