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About this Engineering article
Nano Scale Material Property Measurement of MEMS Material Using Piezo Actuated Material Testing Machine by Lee, Hye Jin; Lee, Nak Kyu; Lee, Hyoung Wook; Park, Hoon Jae; Choi, Tae Hoon is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Lee, Hye Jin; Lee, Nak Kyu; Lee, Hyoung Wook; Park, Hoon Jae; Choi, Tae Hoon
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9752)
- Published
- 2006
- Language
- EN
- Field
- Engineering (Physical Sciences)
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