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About this Engineering article
An Open-Circuit Faults Diagnosis Method for MMC Based on Extreme Gradient Boosting by Xue Hu; Hefei Jia; Yuedong Zhang; Yan Deng is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Xue Hu; Hefei Jia; Yuedong Zhang; Yan Deng
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Published
- 2023
- Language
- EN
- Field
- Engineering (Physical Sciences)
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