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About this Engineering article

Activation of B and As in Ultrashallow Junction During Millisecond Annealing Induced by Thermal Plasma Jet Irradiation by K. Matsumoto; S. Higashi; H. Murakami; S. Miyazaki is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
K. Matsumoto; S. Higashi; H. Murakami; S. Miyazaki
Publisher
Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
Published
2010
Language
EN
Field
Engineering (Physical Sciences)