About this scholarly article

2007 IEEE International Conference on Image Processing - A Mutual Information Based Automatic Registration and Analysis Algorithm for Defect Identification in Printed Documents by Chandu, Kartheek; Saber, Eli; Wu, Wencheng is a scholarly article available to read on EtoBox.

Author

Chandu, Kartheek; Saber, Eli; Wu, Wencheng

Publisher

IEEE

Published

2007

Language

EN