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About this Engineering article
Field-induced cation migration in Cu oxide films by in situ scanning tunneling microscopy by Singh, J. P.; Lu, T.-M.; Wang, G.-C. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Singh, J. P.; Lu, T.-M.; Wang, G.-C.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2003
- Language
- EN
- Field
- Engineering (Physical Sciences)