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About this Engineering article

Integration of Behavioral Models in the Full-Field TLM Method by Scott, I.; Kumar, V.; Christopoulos, C.; Thomas, D.W.P.; Greedy, S.; Sewell, P. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Scott, I.; Kumar, V.; Christopoulos, C.; Thomas, D.W.P.; Greedy, S.; Sewell, P.
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9375)
Published
2012
Field
Engineering (Physical Sciences)

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