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About this Engineering article
Selective Reflection Technique as a Probe to Monitor the Growth of Metallic Thin Film on Dielectric Surfaces by Martins, Weliton Soares; Oriá, Marcos; Chevrollier, Martine; de Silans, Thierry Passerat is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Martins, Weliton Soares; Oriá, Marcos; Chevrollier, Martine; de Silans, Thierry Passerat
- Publisher
- The Optical Society; Optical Society of America (ISSN 1559-128X)
- Published
- 2013
- Language
- EN
- Field
- Engineering (Physical Sciences)