About this scholarly article

2008 Design, Automation and Test in Europe - Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation by Lee, Jeremy; Narayan, Sumit; Kapralos, Mike; Tehranipoor, Mohammad is a scholarly article available to read on EtoBox.

Author

Lee, Jeremy; Narayan, Sumit; Kapralos, Mike; Tehranipoor, Mohammad

Publisher

IEEE

Published

2008

Language

EN