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About this Engineering article
Interlaboratory Study of Eddy-Current Measurement of Excess-Carrier Recombination Lifetime by Blum, Adrienne L.; Swirhun, James S.; Sinton, Ronald A.; Yan, Fei; Herasimenka, Stanislau; Roth, Thomas; Lauer, Kevin; Haunschild, Jonas; Lim, Bianca; Bothe, Karsten; Hameiri, Ziv; Seipel, Bjoern; Xiong, Rentian; Dhamrin, Marwan; Murphy, John D. is a Engineering article available to read on EtoBox.
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- Author
- Blum, Adrienne L.; Swirhun, James S.; Sinton, Ronald A.; Yan, Fei; Herasimenka, Stanislau; Roth, Thomas; Lauer, Kevin; Haunschild, Jonas; Lim, Bianca; Bothe, Karsten; Hameiri, Ziv; Seipel, Bjoern; Xiong, Rentian; Dhamrin, Marwan; Murphy, John D.
- Publisher
- Institute of Electrical and Electronics Engineers; IEEE Electron Devices Society; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 2156-3381)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)