About this scholarly article

26th IEEE VLSI Test Symposium (vts 2008) - Algorithm Level Fault Tolerance: A Technique to Cope with Long Duration Transient Faults in Matrix Multiplication Algorithms by Lisboa, Carlos Arthur Lang; Argyrides, Costas; Pradhan, Dhiraj Kumar; Carro, Luigi is a scholarly article available to read on EtoBox.

Author

Lisboa, Carlos Arthur Lang; Argyrides, Costas; Pradhan, Dhiraj Kumar; Carro, Luigi

Publisher

IEEE

Published

2008

Language

EN