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About this scholarly article
1997 IEEE MTT-S International Microwave Symposium Digest - Transistor parameter extraction using DC, S-parameter and noise data simultaneously by Cai, Q.; Gerber, J.; Daniel, T.; Rohde, U.L. is a scholarly article available to read on EtoBox.
- Author
- Cai, Q.; Gerber, J.; Daniel, T.; Rohde, U.L.
- Publisher
- IEEE
- Published
- 1997
- Language
- EN
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