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About this Engineering article
Focused Ion Beam Etching of Nanometer-Size GaN/AlGaN Device Structures and their Optical Characterization by Micro-Photoluminescence/Raman Mapping by Kuball, M.; Benyoucef, M.; Morrissey, F.H.; Foxon, C.T. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kuball, M.; Benyoucef, M.; Morrissey, F.H.; Foxon, C.T.
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 1999
- Field
- Engineering (Physical Sciences)
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