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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Wavelet Applications in Signal and Image Processing IV - 2D multirate Bayesian framework for multiscale feature detection by Hajj, Hazem M.; Nguyen, Truong Q.; Chin, Roland T.; Unser, Michael A.; Aldroubi, Akram; Laine, Andrew F. is a scholarly article available to read on EtoBox.

Author
Hajj, Hazem M.; Nguyen, Truong Q.; Chin, Roland T.; Unser, Michael A.; Aldroubi, Akram; Laine, Andrew F.
Publisher
SPIE
Published
1996
Language
EN

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