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About this Engineering article
Structure analysis of topmost layer of CNx after repeated sliding using scanning transmission electron microscopy electron energy-loss spectroscopy by Inoue, Hiroshi; Muto, Shunsuke; Deng, Xingrui; Arai, Shigeo; Umehara, Noritsugu is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Inoue, Hiroshi; Muto, Shunsuke; Deng, Xingrui; Arai, Shigeo; Umehara, Noritsugu
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)
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