Opening book details…
About this Engineering article
Evolution of mechanical strain and extended defects in annealed (1 0 0) silicon samples implanted with Ge+ ions by Yu. Suprun-Belevich; F. Cristiano; A. Nejim; P.L.F. Hemment; B.J. Sealy is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yu. Suprun-Belevich; F. Cristiano; A. Nejim; P.L.F. Hemment; B.J. Sealy
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0168-583X)
- Published
- 1998
- Language
- EN
- Field
- Engineering (Physical Sciences)
More by Yu. Suprun-Belevich; F. Cristiano; A. Nejim; P.L.F. Hemment; B.J. Sealy
Browse all works by Yu. Suprun-Belevich; F. Cristiano; A. Nejim; P.L.F. Hemment; B.J. Sealy