About this scholarly article

2014 Silicon Nanoelectronics Workshop (SNW) - Electrical characterisation of horizontal and vertical gate-all-around Si/SiGe nanowires field effect transistors by Salem, B.; Rosaz, G.; Pauc, N.; Gentile, P.; Periwal, P.; Potie, A.; Bassani, F.; David, S.; Baron, T. is a scholarly article available to read on EtoBox.

Author

Salem, B.; Rosaz, G.; Pauc, N.; Gentile, P.; Periwal, P.; Potie, A.; Bassani, F.; David, S.; Baron, T.

Publisher

IEEE

Published

2014