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Can I read Risks to Different Aspects of System Success on EtoBox?
Risks to Different Aspects of System Success by James J. Jiang; Gary Klein is a Business, Management and Accounting article available to read on EtoBox.
What is Risks to Different Aspects of System Success about?
System success is related to many risks associated with information system (IS) development. A common view considers all risks as contributors to a single aspect of success. This view permits controlled research of development complexity. However, some consider system success to be multidimentional with each dimension possibly impacted differently by the various risks. In a survey of 86 IS project managers, the relationship between risk and success is explored. Four IS success measures were found to relate to different risk factors. Project managers can view achievement of a particular success as requiring control of certain risks.
Who reads Risks to Different Aspects of System Success?
It is typically read by researchers, students, and practitioners in Business, Management and Accounting.
- Author
- James J. Jiang; Gary Klein
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0378-7206)
- Published
- 1999
- Language
- EN
- Field
- Business, Management and Accounting (Social Sciences)