About this scholarly article

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - Ellipsometry, Reflectometry, and XPS Comparative Studies of Oxidation Effects on Graded Porous Silicon Antireflection Coatings by Selj, Josefine H.; Tho̸gersen, Annett; Stensrud Marstein, Erik is a scholarly article available to read on EtoBox.

Author

Selj, Josefine H.; Tho̸gersen, Annett; Stensrud Marstein, Erik

Publisher

ECS

Published

2011

Language

EN