About this scholarly article

SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Interferometry: Surface Characterization and Testing - Retrace error: a case study by Geary, Joseph M.; Yoo, K. M.; Si, Guojun; Creath, Katherine; Greivenkamp, John E. is a scholarly article available to read on EtoBox.

Author

Geary, Joseph M.; Yoo, K. M.; Si, Guojun; Creath, Katherine; Greivenkamp, John E.

Publisher

SPIE

Published

1992

Language

EN