About this scholarly article

SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 2 March 2003)] Testing, Reliability, and Application of Micro- and Nano-Material Systems - Nanoscale nondestructive evaluation of materials and devices by ultrasonic atomic force microscopy by Yamanaka, Kazushi; Tsuji, Toshihiro; Irihama, Hiroshi; Mihara, Tsuyoshi; Meyendorf, Norbert; Baaklini, George Y.; Michel, Bernd is a scholarly article available to read on EtoBox.

Author

Yamanaka, Kazushi; Tsuji, Toshihiro; Irihama, Hiroshi; Mihara, Tsuyoshi; Meyendorf, Norbert; Baaklini, George Y.; Michel, Bernd

Publisher

SPIE

Published

2003