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1986-RZW-Steady State Photocarrier Grating (Paper Original) by Fernando is a document available to read on EtoBox.

The document presents a new technique for measuring the diffusion length in photoconductive insulators using a steady-state photocarrier grating created by two interfering laser beams. By measuring the secondary photocurrent perpendicular to the grating fringes and analyzing the results, the method can achieve accurate diffusion length measurements with a precision of 5%. Preliminary data from hydrogenated amorphous silicon samples confirm the effectiveness and accuracy of this technique.

Author
Fernando
Language
EN