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About this Engineering article
Long-Term Characterization of 6H-SiC Transistor Integrated Circuit Technology Operating at 500 °C by Neudeck, Philip; Spry, David J.; Chen, Liang-Yu; Chang, Carl W.; Beheim, Glenn M.; Okojie, Robert S.; Evans, Laura J.; Meredith, Roger D.; Ferrier, Terry L.; Krasowski, Michael J.; Prokop, Norman F. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Neudeck, Philip; Spry, David J.; Chen, Liang-Yu; Chang, Carl W.; Beheim, Glenn M.; Okojie, Robert S.; Evans, Laura J.; Meredith, Roger D.; Ferrier, Terry L.; Krasowski, Michael J.; Prokop, Norman F.
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)