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About this Engineering article
Development of Nanometrology for Nanoelectronics: Growth and Characterization of Transition Metal Monolayer Films on Silicon by Plusnin, N.I.; Il'yashenko, W.M.; Kitan, S.A.; Krylov, S.V. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Plusnin, N.I.; Il'yashenko, W.M.; Kitan, S.A.; Krylov, S.V.
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications Ltd. (ISSN 1662-9795)
- Published
- 2008
- Field
- Engineering (Physical Sciences)
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