About this scholarly article

SPIE Proceedings [SPIE 29th Annual Technical Symposium - San Diego (Tuesday 20 August 1985)] Large Optics Technology - Itek Optical Technology In Manufacturing And Metrology by Egdall, I. M.; Lee, R. K.; Sanger, Gregory M. is a scholarly article available to read on EtoBox.

Author

Egdall, I. M.; Lee, R. K.; Sanger, Gregory M.

Publisher

SPIE

Published

1986

Language

EN