Gate noise in MOS fet's at moderately high frequencies

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English1971

◆First published 1971 · enduring classic

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Published by Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0038-1101) (1971).

Publisher: Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0038-1101)

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Gate noise in MOS fet's at moderately high frequencies by J.W. Haslett; F.N. Trofimenkoff is a scholarly article available to read on EtoBox.

Author: J.W. Haslett; F.N. Trofimenkoff
Publisher: Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0038-1101)
Published: 1971
Language: EN