About this scholarly article

IEEE International Vacuum Electronics Conference - A potential failure reason for Spindt cathodes in high current applications by Li, Xinghui; Bai, Guodong; Li, Hanyan; Ding, Mingqing; Feng, Jinjun; Liao, Fujiang is a scholarly article available to read on EtoBox.

Author

Li, Xinghui; Bai, Guodong; Li, Hanyan; Ding, Mingqing; Feng, Jinjun; Liao, Fujiang

Publisher

IEEE

Published

2014

Language

EN