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About this Engineering article
Temperature-Dependent Impedance Characteristics of Temperature-Stable High-Speed 980-nm VCSELs by Li, Hui; Lott, James A.; Wolf, Philip; Moser, Philip; Larisch, Gunter; Bimberg, Dieter is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Li, Hui; Lott, James A.; Wolf, Philip; Moser, Philip; Larisch, Gunter; Bimberg, Dieter
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1041-1135)
- Published
- 2015
- Language
- EN
- Field
- Engineering (Physical Sciences)