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About this Materials Science article
Crystallite size and microstrain: XRD line broadening analysis of AgSiN thin films by Mohamad Zaidi, Umi Zalilah; Bushroa, A.R.; Ghahnavyeh, Reza Rahbari; Mahmoodian, Reza is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Mohamad Zaidi, Umi Zalilah; Bushroa, A.R.; Ghahnavyeh, Reza Rahbari; Mahmoodian, Reza
- Publisher
- Emerald Group Publishing Limited; Emerald (MCB UP ); Emerald Group Publishing Ltd.; Emerald (ISSN 0369-9420)
- Published
- 2019
- Field
- Materials Science (Physical Sciences)