About this scholarly article

Proceedings of the 8th Great Lakes Symposium on VLSI (Cat. No.98TB100222) - VHDL testability analysis based on fault clustering and implicit fault injection by Bietti, F.S.; Ferrandi, F.; Fummi, F.; Sciuto, D. is a scholarly article available to read on EtoBox.

Author

Bietti, F.S.; Ferrandi, F.; Fummi, F.; Sciuto, D.

Publisher

IEEE Comput. Soc

Published

1998

Language

EN