About this scholarly article

SPIE Proceedings [SPIE High-Speed Electronics and Device Scaling - San Diego, United States (Sunday 18 March 1990)] High-Speed Electronics and Device Scaling - Ultra-submicrometer microwave GaAs MESFETs and HEMTs by Han, Jaeheon; Ryan, Joseph M.; Kriman, Alfred M.; Ferry, David K.; Eastman, Lester F. is a scholarly article available to read on EtoBox.

Author

Han, Jaeheon; Ryan, Joseph M.; Kriman, Alfred M.; Ferry, David K.; Eastman, Lester F.

Publisher

SPIE

Published

1990