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About this Engineering article
High -spatial-resolution X-ray Inspection by Pixelated Scintillator by Miyao, Sho; Tanino, Takahiro; Shigeta, Kazuki is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Miyao, Sho; Tanino, Takahiro; Shigeta, Kazuki
- Publisher
- Japan Institute of Electronics Packaging (ISSN 1883-3365)
- Published
- 2018
- Field
- Engineering (Physical Sciences)
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