About this Engineering article
Electron and ion radiation damage of a-C:H films detected by energy loss spectroscopy of reflected and transmitted electrons by A. Fuchs; K. Jung; H. Ehrhardt; I. Mühling; K. Breuer is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- A. Fuchs; K. Jung; H. Ehrhardt; I. Mühling; K. Breuer
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 1992
- Language
- EN
- Field
- Engineering (Physical Sciences)