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About this Engineering article
Development of a Technique for Characterizing Bias Temperature Instability-Induced Device-to-Device Variation at SRAM-Relevant Conditions by Meng Duan, ; Jian Fu Zhang, ; Zhigang Ji, ; Wei Dong Zhang, ; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Groeseneken, Guido; Asenov, Asen is a Engineering article available to read on EtoBox.
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- Author
- Meng Duan, ; Jian Fu Zhang, ; Zhigang Ji, ; Wei Dong Zhang, ; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Groeseneken, Guido; Asenov, Asen
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2014
- Field
- Engineering (Physical Sciences)