About this scholarly article

2010 International Electron Devices Meeting - Correlation between channel mobility improvements and negative Vth shifts in III–V MISFETs: Dipole fluctuation as new scattering mechanism by Urabe, Yuji; Miyata, Noriyuki; Ishii, Hiroyuki; Itatani, Taro; Maeda, Tatsuro; Yasuda, Tetsuji; Yamada, Hisashi; Fukuhara, Noboru; Hata, Masahiko; Yokoyama, Masafumi; Taoka, Noriyuki; Takenaka, Mitsuru; Takagi, Shinichi is a scholarly article available to read on EtoBox.

Author

Urabe, Yuji; Miyata, Noriyuki; Ishii, Hiroyuki; Itatani, Taro; Maeda, Tatsuro; Yasuda, Tetsuji; Yamada, Hisashi; Fukuhara, Noboru; Hata, Masahiko; Yokoyama, Masafumi; Taoka, Noriyuki; Takenaka, Mitsuru; Takagi, Shinichi

Publisher

IEEE

Published

2010

Language

EN