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About this Engineering article
Pixel-based Absolute Surface Metrology by Three Flat Test with Shifted and Rotated Maps by Zhai, Dede; Chen, Shanyong; Xue, Shuai; Yin, Ziqiang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Zhai, Dede; Chen, Shanyong; Xue, Shuai; Yin, Ziqiang
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0143-8166)
- Published
- 2018
- Language
- EN
- Field
- Engineering (Physical Sciences)
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