Opening book details…
About this Engineering article
A Process Variation Compensating Technique with an On-die Leakage Current Sensor for Nanometer Scale Dynamic Circuits by Kim, C.H.; Roy, K.; Hsu, S.; Krishnamurthy, R.; Borkar, S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kim, C.H.; Roy, K.; Hsu, S.; Krishnamurthy, R.; Borkar, S.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1063-8210)
- Published
- 2006
- Field
- Engineering (Physical Sciences)
More by Kim, C.H.; Roy, K.; Hsu, S.; Krishnamurthy, R.; Borkar, S.
Browse all works by Kim, C.H.; Roy, K.; Hsu, S.; Krishnamurthy, R.; Borkar, S.