Skip to content

Opening book details…

About this Engineering article

X-ray Fluorescence Surface Analysis Using Total Reflection. by Tsuji, Kouichi; Hirokawa, Kichinosuke is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Tsuji, Kouichi; Hirokawa, Kichinosuke
Publisher
The Japan Institute of Metals; Japan Institute of Metals (ISSN 1340-2625)
Published
1996
Field
Engineering (Physical Sciences)

More by Tsuji, Kouichi; Hirokawa, Kichinosuke

Browse all works by Tsuji, Kouichi; Hirokawa, Kichinosuke