About this scholarly article

ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - (Invited) Implications for Robust Reliability Testing of Power SiC MOSFETs by Green, Ronald; Lelis, Aivars; Habersat, Daniel is a scholarly article available to read on EtoBox.

Author

Green, Ronald; Lelis, Aivars; Habersat, Daniel

Publisher

ECS

Published

2011

Language

EN