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About this Engineering article
Reliability and MTTF prediction of K -out-of- n complex systems with components subjected to multiple stages of degradation by PHAM, HOANG; SUPRASAD, A.; MISRA, R. B. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- PHAM, HOANG; SUPRASAD, A.; MISRA, R. B.
- Publisher
- Taylor and Francis Group; Informa UK (Taylor & Francis); Taylor & Francis; Informa UK Limited (ISSN 0020-7721)
- Published
- 1996
- Language
- EN
- Field
- Engineering (Physical Sciences)