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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control - Optical properties of contaminant droplets by Luey, Kenneth T.; Villahermosa, Randy M.; Coleman, Dianne J.; Chen, Philip T. C.; Fleming, John C.; Dittman, Michael G. is a scholarly article available to read on EtoBox.

Author
Luey, Kenneth T.; Villahermosa, Randy M.; Coleman, Dianne J.; Chen, Philip T. C.; Fleming, John C.; Dittman, Michael G.
Publisher
SPIE
Published
2004

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