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About this Engineering article
A Precise Cavity Technique for Measuring Low Resistivity Semiconductors by Brodwin, M.E.; Pao-Sun Lu, is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Brodwin, M.E.; Pao-Sun Lu,
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9219)
- Published
- 1965
- Field
- Engineering (Physical Sciences)