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About this Engineering article
Uniaxial Strain Induced Critical Current Degradation of Ag-Sheathed Bi-2212 Round Wire by Dai, Chao; Qin, Jinggang; Liu, Bo; Liu, Peihang; Wu, Yu; Nijhuis, Arend; Zhou, Chao; Li, Chenshan; Hao, Qingbin; Liu, Sheng is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Dai, Chao; Qin, Jinggang; Liu, Bo; Liu, Peihang; Wu, Yu; Nijhuis, Arend; Zhou, Chao; Li, Chenshan; Hao, Qingbin; Liu, Sheng
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1051-8223)
- Published
- 2018
- Field
- Engineering (Physical Sciences)