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About this Materials Science article
Nanovoid characterization of nominally pure aluminium using synchrotron small angle X-ray Scattering (SAXS) methods by Chaudhuri, A.; Singh, M.A.; Diak, B.J.; Cuoppolo, C.; Woll, A.R. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Chaudhuri, A.; Singh, M.A.; Diak, B.J.; Cuoppolo, C.; Woll, A.R.
- Publisher
- Taylor and Francis Group; Informa UK (Taylor & Francis); Taylor & Francis; Taylor and Francis Ltd.; Informa UK Limited (ISSN 1478-6435)
- Published
- 2013
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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