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About this scholarly article
Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003. - Challenges and advances in use-condition-based mechanical reliability test development by Mercado, L.L.; Sahasrabudhe, S.; Monroe, E. is a scholarly article available to read on EtoBox.
- Author
- Mercado, L.L.; Sahasrabudhe, S.; Monroe, E.
- Publisher
- IEEE
- Published
- 2003
- Language
- EN
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