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About this Engineering article
Investigation on Device Characteristics of MOSFET Transistor Placed Under Bond Pad for High-Pin-Count SOC Applications by Ker, M.-D.; Peng, J.-J. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ker, M.-D.; Peng, J.-J.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1521-3331)
- Published
- 2004
- Field
- Engineering (Physical Sciences)