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About this Engineering article
Excess low-frequency noise in YBCO thin-film devices by Macfarlane, J.C.; Ling Hao, ; Pegrum, C.M.; Donaldson, G.B. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Macfarlane, J.C.; Ling Hao, ; Pegrum, C.M.; Donaldson, G.B.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1051-8223)
- Published
- 1995
- Language
- EN
- Field
- Engineering (Physical Sciences)
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