About this scholarly article

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - Using on-chip test pattern compression for full scan SoC designs by Lang, H.; Pfeiffer, J.; Maguire, J. is a scholarly article available to read on EtoBox.

Author

Lang, H.; Pfeiffer, J.; Maguire, J.

Publisher

Int. Test Conference

Published

2000